掃碼咨詢
掃碼咨詢
億博CE認(rèn)證服務(wù)公司,協(xié)助企業(yè)順利獲得歐盟CE認(rèn)證,是專業(yè)的歐盟CE認(rèn)證公司，有產(chǎn)品辦理CE檢測可以咨詢我們，服務(wù)熱線：135-7084-7473
2010年1月22日，南非獨立通信管理局(ICASA)發(fā)布了《電子通訊設(shè)備技術(shù)標(biāo)準(zhǔn)法規(guī)》。2013年4月16日，ICASA又發(fā)布了有關(guān)實施該法規(guī)的公告。法規(guī)及公告中都規(guī)定了技術(shù)設(shè)備和電子通訊設(shè)備的ICASA法規(guī)符合性標(biāo)準(zhǔn)清單，這些標(biāo)準(zhǔn)主要涉及設(shè)備的電磁兼容(EMC)標(biāo)準(zhǔn)、安全標(biāo)準(zhǔn)和性能標(biāo)準(zhǔn)。其中，EMC標(biāo)準(zhǔn)還包括基礎(chǔ)EMC標(biāo)準(zhǔn)，通用EMC標(biāo)準(zhǔn)和產(chǎn)品/產(chǎn)品族的EMC標(biāo)準(zhǔn)。表1、表2、表3列出了設(shè)備進(jìn)行ICASA認(rèn)證的基礎(chǔ)EMC標(biāo)準(zhǔn)、通用EMC標(biāo)準(zhǔn)和安全標(biāo)準(zhǔn)。
表1 技術(shù)設(shè)備和電子通訊設(shè)備ICASA認(rèn)證的基礎(chǔ)EMC標(biāo)準(zhǔn)
|
設(shè)備所述類型
|
適用標(biāo)準(zhǔn)
|
|
Radio disturbance and immunity apparatus - Measuring apparatus
|
SANS 216-1-1[CISPR 16-1-1 ed2.1](CISPR 16 -1 -1 ed3)
|
|
Radio disturbance and immunity apparatus - Conducted disturbances
|
SANS 216-1-2(CISPR 16-1-2 ed1.2)
|
|
Radio disturbance and immunity apparatus - Disturbance power
|
SANS 216-1-3(CISPR 16-1-3 ed2)
|
|
Radio disturbance and immunity apparatus - Radiated disturbance
|
SANS 216-1-4[CISPR 16-1-4 ed2](CISPR 16-1-4 ed3)
|
|
Radio disturbance and immunity apparatus - Antenna calibration test sites for 30 MHz to 1000MHz
|
SANS 216-1-5(CISPR 16-1-5 ed1)
|
|
Method of measurement of disturbances and immunity - Conducted disturbance measurements
|
SANS 216-2-1[CISPR 16-2-1 ed1.1](CISPR 16-2-1 ed2)
|
|
Method of measurement of disturbances and immunity - Measurement of disturbance power
|
SANS 216-2-2[CISPR 16-2-2 ed1.2](CISPR 16-2-2 ed2)
|
|
Method of measurement of disturbances and immunity - Radiated disturbance measurements
|
SANS 216-2-3[CISPR 16-2-3 ed2](CISPR 16-2-3 ed3)
|
|
Method of measurement of disturbances and immunity - immunity measurements
|
SANS 216-2-4(CISPR 16-2-4 ed1)
|
|
Limits for harmonic current emissions (equipment input current <= 6A per phase)
|
SANS 61000-3-2[IEC 61000-16-3-2 ed3](IEC 61000-3-2 ed3.2)
|
|
Limits - Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems, for equipment with rated current <= 16 A per phase and not subject to conditional connection
|
SANS 61000-3-3(IEC 61000-3-3 ed1.2)&SANS 61000-3-3(IEC 61000-3-3 Ed2)
|
|
Limits - Limitation of emission of harmonic currents in low-voltage power supply systems for equipment with rated current greater than 16 A
|
SANS 61000-3-4(IEC 61000-3-4 ed1)
|
|
Limits Limitations and flicker in low-voltage power supply systems for equipment with rated current greater than 16A
|
SANS 61000-3-5[IEC 61000-3-5 ed1](IEC 61000-3-5 ed2)
|
|
Limits Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems - equipment with rated current <= 75A and subject to conditional connection
|
SANS 61000-3-11(IEC 61000-3-11 ed1)
|
|
Electrostatic discharge immunity test
|
SANS 61000-4-2[IEC 61000-4-2 ed1.2](IEC 61000-4-2 ed2)
|
|
Radiated, radio-frequency, electromagnetic field immunity test
|
SANS 61000-4-3[IEC 61000-4-3 ed3](IEC 61000-4-3 ed3. 1)
|
|
Electrical fast transient/burst immunity test
|
SANS 61000-4-4(IEC 61000-4-4 ed2)
|
|
Surge immunity test
|
SANS 61000-4-5(IEC 61000-4-5 ed2)
|
|
Immunity to conducted disturbances, induced by radio-frequency fields
|
SANS 61000-4-6[IEC 61000-4-6 ed2.2](IEC 61000-4-6 ed3)
|
|
General guide on harmonics and interharmonics measurements and instrumentation, forpower supply systems and equipment connected
|
SANS 61000-4-7[IEC 61000-4-7 ed2](IEC 61000-4-7 ed2.1)
|
|
Power frequency magnetic field immunity test
|
SANS 61000-4-8[IEC 61000-4-8 ed1.1](IEC 61000-4-8 ed2)
|
|
Pulse magnetic field immunity test
|
SANS 61000-4-9(IEC 61000-4-9 ed1 1)
|
|
Damped oscillatory magnetic field immunity test
|
SANS 61000-4-10(IEC 61000-4-10 ed1.1)
|
|
Voltage dips, short interruptions and voltage variations immunity tests
|
SANS 61000-4-11(IEC 61000-4-11 ed1)
|
|
Oscillatory waves immunity test
|
SANS 61000-4-12(IEC 61000-4-12 ed2)
|
|
Harmonics and interharmonics including mains signalling at a.c. power port, low frequencyimmunity tests
|
SANS 61000-4-13[IEC 61000-16-4-13 ed1](IEC 61000-4-13 ed1.1)
|
|
Voltage fluctuation immunity test
|
SANS 61000-4-14[IEC 61000-16-4-14 ed1.1](IEC 61000-4-14 ed1.2)
|
|
Test for disturbances in the frequency range 0 Hz to 150 kHz
|
SANS 61000-4-16(IEC 61000-4-16 ed1.1)
|
|
Ripple on d.c. input power port immunity test
|
SANS 61000-4-17[IEC 61000-4-17 ed1.1](IEC 61000-4-17 ed1.2)
|
|
Emission and immunity testing in transverse electromagnetic (TEM) waveguides
|
SANS 61000-4-20[IEC 61000-4-20 ed1.1](IEC 61000-4-20 ed2)
|
|
Unbalance, immunity test
|
SANS 61000-4-27[IEC 61000-4-17 edl](IEC 61000-4-27 ed1.1)
|
|
Variation of power frequency, immunity test
|
SANS 61000-4-28[IEC 61000-4-28 ed1.1](IEC 61000-4-28 ed1.2)
|
|
Voltage dips, short interruptions and voltage variations on d.c. input power port immunity tests
|
SANS 61000-4-29(IEC 61000-4-29 ed1)
|
|
Power quality measurement methods
|
SANS 61000-4-30[IEC 61000-4-30 ed1](IEC 61000-4-30 ed2)
|
|
Power supply interface at the input to telecommunication equipment Part 1: Operated byalternating (ac) derived from direct current (dc) sources
|
SANS 300132-1(ETS300132-1 V1)
|
|
Power supply interface at the input to telecommunication equipment Part 2: Operated by directcurrent (dc)
|
SANS 300132-2(ETS300132-2 V2.1.2)
|
|
Power supply interface at the input to telecommunication equipment Part 3: Operated byrectified current source, alternating current source or direct current source up to 400 V
|
SANS 300132-3(ETS300132-3 V1.2.1)
|
表2技術(shù)設(shè)備和電子通訊設(shè)備ICASA認(rèn)證的通用EMC標(biāo)準(zhǔn)
|
設(shè)備所述類型
|
適用標(biāo)準(zhǔn)
|
|
Radio disturbance and immunity apparatus - Measuring apparatus
|
SANS 216-1-1[CISPR 16-1-1 ed2.1](CISPR 16 -1 -1 ed3)
|
|
Radio disturbance and immunity apparatus - Conducted disturbances
|
SANS 216-1-2(CISPR 16-1-2 ed1.2)
|
|
Radio disturbance and immunity apparatus - Disturbance power
|
SANS 216-1-3(CISPR 16-1-3 ed2)
|
|
Radio disturbance and immunity apparatus - Radiated disturbance
|
SANS 216-1-4[CISPR 16-1-4 ed2](CISPR 16-1-4 ed3)
|
|
Radio disturbance and immunity apparatus - Antenna calibration test sites for 30 MHz to 1000MHz
|
SANS 216-1-5(CISPR 16-1-5 ed1)
|
|
Method of measurement of disturbances and immunity - Conducted disturbance measurements
|
SANS 216-2-1[CISPR 16-2-1 ed1.1](CISPR 16-2-1 ed2)
|
|
Method of measurement of disturbances and immunity - Measurement of disturbance power
|
SANS 216-2-2[CISPR 16-2-2 ed1.2](CISPR 16-2-2 ed2)
|
|
Method of measurement of disturbances and immunity - Radiated disturbance measurements
|
SANS 216-2-3[CISPR 16-2-3 ed2](CISPR 16-2-3 ed3)
|
|
Method of measurement of disturbances and immunity - immunity measurements
|
SANS 216-2-4(CISPR 16-2-4 ed1)
|
|
Limits for harmonic current emissions (equipment input current <= 6A per phase)
|
SANS 61000-3-2[IEC 61000-16-3-2 ed3](IEC 61000-3-2 ed3.2)
|
|
Limits - Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems, for equipment with rated current <= 16 A per phase and not subject to conditional connection
|
SANS 61000-3-3(IEC 61000-3-3 ed1.2)&SANS 61000-3-3(IEC 61000-3-3 Ed2)
|
|
Limits - Limitation of emission of harmonic currents in low-voltage power supply systems for equipment with rated current greater than 16 A
|
SANS 61000-3-4(IEC 61000-3-4 ed1)
|
|
Limits Limitations and flicker in low-voltage power supply systems for equipment with rated current greater than 16A
|
SANS 61000-3-5[IEC 61000-3-5 ed1](IEC 61000-3-5 ed2)
|
|
Limits Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems - equipment with rated current <= 75A and subject to conditional connection
|
SANS 61000-3-11(IEC 61000-3-11 ed1)
|
|
Electrostatic discharge immunity test
|
SANS 61000-4-2[IEC 61000-4-2 ed1.2](IEC 61000-4-2 ed2)
|
|
Radiated, radio-frequency, electromagnetic field immunity test
|
SANS 61000-4-3[IEC 61000-4-3 ed3](IEC 61000-4-3 ed3. 1)
|
|
Electrical fast transient/burst immunity test
|
SANS 61000-4-4(IEC 61000-4-4 ed2)
|
|
Surge immunity test
|
SANS 61000-4-5(IEC 61000-4-5 ed2)
|
|
Immunity to conducted disturbances, induced by radio-frequency fields
|
SANS 61000-4-6[IEC 61000-4-6 ed2.2](IEC 61000-4-6 ed3)
|
|
General guide on harmonics and interharmonics measurements and instrumentation, forpower supply systems and equipment connected
|
SANS 61000-4-7[IEC 61000-4-7 ed2](IEC 61000-4-7 ed2.1)
|
|
Power frequency magnetic field immunity test
|
SANS 61000-4-8[IEC 61000-4-8 ed1.1](IEC 61000-4-8 ed2)
|
|
Pulse magnetic field immunity test
|
SANS 61000-4-9(IEC 61000-4-9 ed1 1)
|
|
Damped oscillatory magnetic field immunity test
|
SANS 61000-4-10(IEC 61000-4-10 ed1.1)
|
|
Voltage dips, short interruptions and voltage variations immunity tests
|
SANS 61000-4-11(IEC 61000-4-11 ed1)
|
|
Oscillatory waves immunity test
|
SANS 61000-4-12(IEC 61000-4-12 ed2)
|
|
Harmonics and interharmonics including mains signalling at a.c. power port, low frequencyimmunity tests
|
SANS 61000-4-13[IEC 61000-16-4-13 ed1](IEC 61000-4-13 ed1.1)
|
|
Voltage fluctuation immunity test
|
SANS 61000-4-14[IEC 61000-16-4-14 ed1.1](IEC 61000-4-14 ed1.2)
|
|
Test for disturbances in the frequency range 0 Hz to 150 kHz
|
SANS 61000-4-16(IEC 61000-4-16 ed1.1)
|
|
Ripple on d.c. input power port immunity test
|
SANS 61000-4-17[IEC 61000-4-17 ed1.1](IEC 61000-4-17 ed1.2)
|
|
Emission and immunity testing in transverse electromagnetic (TEM) waveguides
|
SANS 61000-4-20[IEC 61000-4-20 ed1.1](IEC 61000-4-20 ed2)
|
|
Unbalance, immunity test
|
SANS 61000-4-27[IEC 61000-4-17 edl](IEC 61000-4-27 ed1.1)
|
|
Variation of power frequency, immunity test
|
SANS 61000-4-28[IEC 61000-4-28 ed1.1](IEC 61000-4-28 ed1.2)
|
|
Voltage dips, short interruptions and voltage variations on d.c. input power port immunity tests
|
SANS 61000-4-29(IEC 61000-4-29 ed1)
|
|
Power quality measurement methods
|
SANS 61000-4-30[IEC 61000-4-30 ed1](IEC 61000-4-30 ed2)
|
|
Power supply interface at the input to telecommunication equipment Part 1: Operated byalternating (ac) derived from direct current (dc) sources
|
SANS 300132-1(ETS300132-1 V1)
|
|
Power supply interface at the input to telecommunication equipment Part 2: Operated by directcurrent (dc)
|
SANS 300132-2(ETS300132-2 V2.1.2)
|
|
Power supply interface at the input to telecommunication equipment Part 3: Operated byrectified current source, alternating current source or direct current source up to 400 V
|
SANS 300132-3(ETS300132-3 V1.2.1)
|
表3 技術(shù)設(shè)備和電子通訊設(shè)備ICASA認(rèn)證的安全標(biāo)準(zhǔn)
|
設(shè)備類別
|
適用標(biāo)準(zhǔn)
|
被替代的標(biāo)準(zhǔn)
|
|
信息技術(shù)設(shè)備的安全
|
SANS 60950（IEC60950 ed2）
|
SANS 60950（IEC60950 ed1）
|
|
音頻、視頻及類似電子設(shè)備
|
SANS 60065（IEC 60065）
|
無
|
|
測試、測量、控制及實驗室用的電子設(shè)備
|
SANS 61010-1（IEC 61010-1）
|
無
|
何婷婷 2015年進(jìn)入億博檢測技術(shù)有限公司，擔(dān)任高級銷售顧問。
精通各類檢測認(rèn)證標(biāo)準(zhǔn)，服務(wù)過上千家企業(yè)。 聯(lián)系方式：13570847473（微信同號） 座機(jī)：0755-33126673 傳真：0755-22639141
郵箱：kefu@ebotek.cn
地址：深圳市寶安區(qū)西鄉(xiāng)街道銀田工業(yè)區(qū)僑鴻盛文化創(chuàng)意園A棟219-220
掃一掃加顧問微信
